Partners |
Associates |
Technical Advisors |
| Patrick J. Fay | Joshua M. Herman | Ji (Alexander) Lei |
| Oleg F. Kaplun | Michael L. Ross | Samia Chaudry |
| Michael J. Marcin | John H. Noh | |
| Dervis Magistre | Anita Chang |
Patrick J. Fay
Education
- J.D., University of Notre Dame, 1990
- B.E., Rensselaer Polytechnic Institute, 1987
Mechanical Engineering
- New York
- Court of Appeals for the Federal Circuit
- U.S. District Courts for the Southern and Eastern Districts of New York
- Registered Patent Attorney, U.S. Patent and Trademark Office
- Mandarin Chinese
Patrick J. Fay has over fifteen years experience in all areas of intellectual property law, with a particular emphasis on patent prosecution, counseling, litigation and licensing.
Mr. Fay has extensive experience in all areas of patent prosecution, both U.S. and foreign, including reexamination, reissue and interference, relating to medical devices, electrical and mechanical technologies, the Internet and business methods.
He also counsels inventors and patent owners on the scope and validity of their intellectual properties and gives guidance to clients introducing new products and services as to possible infringement of the patent rights of others. In addition, Mr. Fay evaluates the intellectual property portfolios of acquisition targets and assists organizations in establishing or improving systems for protecting their intellectual property. Mr. Fay's clients include Internet and technology companies, manufacturers of medical devices and major universities.
Mr. Fay is on the Board of Editors of Patent Strategy & Management and is a member of the American Bar Association, the New York Intellectual Property Law Association and the New York State Bar Association.
He lives in Manhattan with his wife and two daughters.